High-Speed Burn-In Tester

[INQ. NO. 2108E21] With global semiconductor manufacturers as its customers, UniTest Co., Ltd. is a company that manufactures semiconductor-testing equipment.
Since its establishment in 2000, the company has been growing by expanding its business areas into the production of testing equipment used for memory products and for system IC through its subsidiary.
UNI940A, the main product of the manufacturer, is a high-speed burn-in tester used to assess the performance of a memory semiconductor upon being produced. A burn-in tester in general is used to detect defects of a semiconductor product in advance by exposing it to external extreme conditions followed by high/low temperatures and voltage changes and conducting accelerated life tests.
UNI940A equipped with high-speed technology has greatly improved the performance of burn-in testers. Increasing the speed of a previous burn-in tester from 20~30Mhz to 200Mhz, the newly developed tester allows tests during burn-in (TDBI) and hot/cold function tests at the same time, for the first time in the world.

With UNI940A, customers are able to reduce costs, increase production-yield rates and improve quality by conducting a single high-speed burn-in process into which TDBI, hot/cold function tests and RA (Repair) process are all integrated.
UNI940A tests semiconductors in the chip state after post-process packaging is completed. The size of the testing equipment is 3,600mm X 2,000mm X 2,225mm (W x D x H) and is capable of inspecting some 6,000 semiconductor chips at the same time.
With temperatures ranging from -10°C to 125°C during the burn-in process as a basic option, UNI940A is customized to meet varied specifications requested by a number of customers and has advanced into the Korean, Taiwanese, and Chinese markets.

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